A new test pattern generation method for delay fault testing.
S. CremouxChristophe FagotPatrick GirardChristian LandraultSerge PravossoudovitchPublished in: VTS (1996)
Keyphrases
- generation method
- test cases
- test generation
- test data
- test suite
- software testing
- test sequences
- feature generation
- pattern matching
- fault diagnosis
- model based testing
- testing process
- statistical tests
- fault detection
- fault model
- usability testing
- test set
- unit testing
- test case generation
- integration testing
- code coverage
- genetic algorithm
- test data generation
- regression testing
- bit rate
- software engineering
- decision trees
- information systems