An optimized BIST test pattern generator for delay testing.

Patrick Girard Christian Landrault V. Moreda Serge Pravossoudovitch

Published in: VTS (1997)

Keyphrases

pattern generator
test cases
test data
test generation
test case generation
software testing
case study
testing process
humanoid robot
statistical tests
image processing
test suite
statistical significance
test sequences
regression testing
critical path
high dimensional
set of test cases
built in self test