V. Moreda

Publication Activity (10 Years)

Years Active: 1997-1999
Publications (10 Years): 0

Publications

Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel
A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. J. Electron. Test. 14 (1-2) (1999)
Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel
A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium (1998)
Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch
An optimized BIST test pattern generator for delay testing. VTS (1997)