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A BIST Structure to Test Delay Faults in a Scan Environment.

Patrick GirardChristian LandraultV. MoredaSerge PravossoudovitchArnaud Virazel
Published in: Asian Test Symposium (1998)
Keyphrases
  • built in self test
  • real time
  • mobile robot
  • test cases
  • neural network
  • learning algorithm
  • expert systems
  • fault diagnosis
  • statistically significant
  • hierarchical structure
  • structural information
  • graph structure