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A BIST Structure to Test Delay Faults in a Scan Environment.
Patrick Girard
Christian Landrault
V. Moreda
Serge Pravossoudovitch
Arnaud Virazel
Published in:
Asian Test Symposium (1998)
Keyphrases
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built in self test
real time
mobile robot
test cases
neural network
learning algorithm
expert systems
fault diagnosis
statistically significant
hierarchical structure
structural information
graph structure