Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.
Vladimir PascaLorena AnghelMounir BenabdenbiPublished in: J. Electron. Test. (2012)
Keyphrases
- fault diagnosis
- fault detection
- multiple faults
- high speed
- built in self test
- action recognition
- fault model
- fault detection and diagnosis
- fault detection and isolation
- incipient fault
- fault management
- neural network
- normal operation
- expert systems
- failure modes
- repair actions
- low cost
- fault localization
- diagnostic reasoning
- gas turbine
- diagnostic tests
- data sets
- high density
- medical diagnosis
- causal reasoning
- transmission line
- model based diagnosis
- fault models
- integrated circuit
- low power
- computer aided
- multi sensor information fusion