Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults.
Peikun WangAmir Masoud GharehbaghiMasahiro FujitaPublished in: ISQED (2019)
Keyphrases
- test cases
- fault diagnosis
- built in self test
- fault detection
- model based diagnosis
- fault detection and diagnosis
- root cause
- fault model
- mutation testing
- data driven
- multiple faults
- fault detection and isolation
- fully automatic
- abnormal events
- error detection
- databases
- similar patterns
- software testing
- data sets
- integrated circuit
- pattern mining
- test data
- genetic algorithm
- web pages