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Experts
- Zhan Song
- Joaquim Salvi
- Sukhan Lee
- Changsoo Je
- Sang Wook Lee
- Mohit Gupta
- Tomislav Pribanic
- Hiroshi Kawasaki
- Christophe Doignon
- Pierre Graebling
- Shree K. Nayar
- Christoph Schmalz
- Kwang Hee Lee
- Aswin C. Sankaranarayanan
- Ryusuke Sagawa
- Tomislav Petkovic
- Jordi Pagès
- Luc Van Gool
- Youfu Li
- Ryo Furukawa
- Peng Li
- Muhammad Atif
- Frank Forster
- Siyuan Liu
- El Mustapha Mouaddib
- Feifei Gu
- Idaku Ishii
- Rae-Hong Park
- Zhiwei Xiong
- Ravi Ramamoorthi
- Parinya Punpongsanon
- Peter Eisert
- Thomas P. Koninckx
- Qingchang Tan
- Yueyi Zhang
- Nahum Kiryati
- Jing Xu
- Kosuke Sato
- Daisuke Iwai
Venues
- CoRR
- Sensors
- IROS
- ICRA
- IEEE Trans. Instrum. Meas.
- ICCV
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Pattern Recognit.
- ICIP
- Image Vis. Comput.
- CVPR Workshops
- ROBIO
- 3DPVT
- ICCV Workshops
- 3DV
- VISIGRAPP (4: VISAPP)
- ISCAS
- J. Real Time Image Process.
- IEEE Trans. Ind. Electron.
- BMVC
- Real-Time Image and Video Processing
- VMV
- IECON
- 3DIM
- IEEE Trans. Image Process.
- ISVC (1)
- MVA
- Three-Dimensional Image Processing, Measurement (3DIPM), and Applications
- ICIAR
- VISIGRAPP (5: VISAPP)
- J. Comb. Theory, Ser. B
- Int. J. Pattern Recognit. Artif. Intell.
- ICDMA
- ISMAR
- Math. Comput. Simul.
- ACM Trans. Graph.
- Signal Process.
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