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Experts
- Alexander M. Bronstein
- Ron Kimmel
- François Chaumette
- Dan Raviv
- Christophe Collewet
- Michael M. Bronstein
- Klaus Voss
- Nir A. Sochen
- Anders Heyden
- Igor Faradjev
- Vincent Lepetit
- H. C. Sim
- Reinhard Klette
- Yang Xiao
- Tae-Kyun Kim
- Zoltan Kato
- Feng Guo
- Jianzhuang Liu
- Hayder Radha
- Yilun Chen
- Christos Varytimidis
- Sayan Bandyapadhyay
- Aritra Banik
- Pedro J. Sanz
- Sujoy Bhore
- Konstantinos Rapantzikos
- Yannis Avrithis
- Faouzi Ghorbel
- Joseph M. Francos
- Haibin Ling
- Xiaoou Tang
- Martin Nöllenburg
- Julia Shemiakina
- Mathieu Salzmann
- Carme Torras
- Rami R. Hagege
- Yan-Bin Jia
- Robert I. Damper
- Su Pang
Venues
- CoRR
- CVPR
- ICRA
- IROS
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ICPR
- IEEE Access
- BMVC
- ICIP
- ICASSP
- Pattern Recognit. Lett.
- Sensors
- Int. J. Comput. Vis.
- Comput. Vis. Image Underst.
- Appl. Math. Comput.
- J. Math. Imaging Vis.
- Comput. Aided Des.
- Remote. Sens.
- ROBIO
- Symmetry
- IEEE Trans. Image Process.
- Comput. Graph.
- Image Vis. Comput.
- WACV
- Int. J. Bifurc. Chaos
- Int. J. Robotics Res.
- Comput. Electron. Agric.
- CASE
- Math. Log. Q.
- 3DV
- IEEE Trans. Robotics
- DICTA
- DAGM-Symposium
- SIAM J. Sci. Comput.
- Comput. Graph. Forum
- Multim. Tools Appl.
- ICMV
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