INTRINSIC AND EXTRINSIC PARAMETERS
Experts
- John Mallon
- Paul F. Whelan
- Guoqin Yuan
- Lina Zheng
- Yuan Zheng
- Davide Scaramuzza
- Liang Li
- Jaehyeon Kang
- Jacek Komorowski
- Przemyslaw Rokita
- Bumchul Jang
- Guohang Yan
- Masa Hu
- Xueji Liu
- Mathias Gehrig
- Yikang Li
- Zhuang Zhang
- Murtaza Taj
- Guo-Qing Wei
- Abhinav Kumar
- Brendan P. Byrne
- Hung-Tat Tsui
- Manasi Muglikar
- Jorge Beltrán
- Peter F. Sturm
- Fernando GarcÃa
- Renato Martins
- Olivier Morel
- Talha Hanif Butt
- Stewart Worrall
- Jianjun Sun
- Gunhee Koo
- Surabhi Verma
- Daniel Gehrig
- Christopher Ruf
- Ying Yu
- Julie Stephany Berrio
- Song De Ma
- Xiaoming Liu
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Remote. Sens.
- ICPR
- IROS
- Comput. Vis. Image Underst.
- ICRA
- ICCV
- ICDSC
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- CVPR Workshops
- SCIA
- VCIP
- ICIRA (2)
- CCIS
- ICASSP
- IEEE Trans. Intell. Transp. Syst.
- CASE
- IEEE Trans. Geosci. Remote. Sens.
- Image Vis. Comput.
- IEEE Robotics Autom. Lett.
- SMC
- 3DV
- DICTA
- J. Electronic Imaging
- ROBIO
- Int. J. Autom. Technol.
- CVPR
- ICPR (4)
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Robotica
- SIBGRAPI
- VISAPP (1)
- MCPR
- FUSION
- IEEE Instrum. Meas. Mag.
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