INTRINSIC AND EXTRINSIC PARAMETERS
Experts
- Paul F. Whelan
- John Mallon
- Yuan Zheng
- Guoqin Yuan
- Lina Zheng
- Yikang Li
- Zhuang Zhang
- Xueji Liu
- Mathias Gehrig
- Masa Hu
- Manasi Muglikar
- Brendan P. Byrne
- Hung-Tat Tsui
- Murtaza Taj
- Guo-Qing Wei
- Abhinav Kumar
- Jaehyeon Kang
- Liang Li
- Davide Scaramuzza
- Bumchul Jang
- Przemyslaw Rokita
- Guohang Yan
- Jacek Komorowski
- Carlos Guindel
- Peng Wang
- Joaquin Rodriguez
- Julie Stephany Berrio
- Song De Ma
- Xiaoming Liu
- Ying Yu
- Daniel Gehrig
- Christopher Ruf
- Nakju Lett Doh
- Eduardo M. Nebot
- Zhanyi Hu
- Shengjie Zhu
- Fernando García
- Olivier Morel
- Peter F. Sturm
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- IROS
- ICPR
- Remote. Sens.
- Comput. Vis. Image Underst.
- ICRA
- ICCV
- ICASSP
- 3DV
- IEEE Robotics Autom. Lett.
- Image Vis. Comput.
- SMC
- ICDSC
- ROBIO
- DICTA
- J. Electronic Imaging
- SCIA
- CVPR Workshops
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Geosci. Remote. Sens.
- CASE
- IEEE Trans. Intell. Transp. Syst.
- ICIRA (2)
- VCIP
- CCIS
- VSSN@MM
- ICCVG
- ISMAR Adjunct
- ISVC (2)
- Robotics Auton. Syst.
- CCCV (1)
- ISVC (1)
- ICPCSEE (1)
- J. Inf. Process. Syst.
- IGARSS (4)
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