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Experts
- Trevor Darrell
- Cewu Lu
- Cordelia Schmid
- Jian Sun
- Shuran Song
- Kate Saenko
- Li Yi
- Alan L. Yuille
- Jeff Donahue
- Nassir Navab
- Pietro Perona
- Kui Jia
- Yunzhi Lin
- Tinne Tuytelaars
- Yan Wang
- Sven Behnke
- Russ Tedrake
- Patricio A. Vela
- Ming-Ming Cheng
- Yiu-ming Cheung
- Stephen Tyree
- Yi Yang
- Jiashi Feng
- Jonathan Tremblay
- Xiangyang Xue
- Leonidas J. Guibas
- Boqing Gong
- Wei Gao
- Bowen Wen
- Stan Birchfield
- He Wang
- Thomas S. Huang
- Kostas E. Bekris
- Shigang Chen
- Lingxi Xie
- Liang Zheng
- Michael S. Lew
- Dawei Du
- Dongdong Chen
Venues
- CoRR
- CVPR
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- AAAI
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- IROS
- Int. J. Comput. Vis.
- ICIP
- IEEE Robotics Autom. Lett.
- Pattern Recognit.
- Neurocomputing
- BMVC
- Remote. Sens.
- IEEE Trans. Image Process.
- WACV
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- IEEE Access
- ICPR
- Pattern Recognit. Lett.
- ACM Multimedia
- ICCV Workshops
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- Comput. Vis. Image Underst.
- ICML
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- NIPS
- Multim. Tools Appl.
- Sensors
- ECCV (4)
- AVSS
- CogSci
- IEEE Trans. Multim.
- ICTAI
- Appl. Intell.
- Comput. Graph.
- IEEE Signal Process. Lett.
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