Vladimír Székely

Publication Activity (10 Years)

Years Active: 1993-2015
Publications (10 Years): 1

Top Topics

Photometric Stereo

Systematic Errors

Surface Normals

Top Venues

Microelectron. J.

Int. J. Circuit Theory Appl.

Publications

Vladimír Székely, Albin Szalai
Transformation between linear network features in convolution approach. Int. J. Circuit Theory Appl. 43 (1) (2015)
Vladimír Székely, Albin Szalai
Measurement of the time-constant spectrum: Systematic errors, correction. Microelectron. J. 43 (11) (2012)
Albin Szalai, Vladimír Székely
Possible acception criteria for structure functions. Microelectron. J. 43 (2) (2012)
László Pohl, Zsolt Kohári, Vladimír Székely
Fast field solver for the simulation of large-area OLEDs. Microelectron. J. 41 (9) (2010)
Vladimír Székely
Evaluation of short pulse and short time thermal transient measurements. Microelectron. J. 41 (9) (2010)
Vladimír Székely, Clemens J. M. Lasance
Editorial. Microelectron. J. 41 (9) (2010)
Péter G. Szabó, Vladimír Székely
Characterization and Modeling of an Electro-thermal MEMS Structure CoRR (2008)
Zoltán Szucs, György Bognár, Vladimír Székely, Márta Rencz
Contactless Thermal Characterization of High Temperature Test Chamber CoRR (2008)
György Bognár, Vladimír Székely, Márta Rencz
Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array CoRR (2007)
György Bognár, Gyula Horváth, Zoltán Szucs, Vladimír Székely
Die Attach Quality Testing by Fully Contact-less Measurement Method. DDECS (2006)
Vladimír Székely
Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). Microelectron. J. 35 (10) (2004)
Márta Rencz, Vladimír Székely, András Poppe
A Fast Algorithm for the Layout Based Electro-Thermal Simulation. DATE (2003)
Vladimír Székely
Enhancing reliability with thermal transient testing. Microelectron. Reliab. 42 (4-5) (2002)
Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois
IDDQ Testing of Submicron CMOS - by Cooling? J. Electron. Test. 16 (5) (2000)
Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
Design and Test of MEMs. VLSI Design (1999)
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12 (1-2) (1998)
Vladimír Székely, Márta Rencz
Fast Field Solvers for Thermal and Electrostatic Analysis. DATE (1998)
Vladimír Székely, Márta Rencz, Bernard Courtois
Tracing the Thermal Behavior of ICs. IEEE Des. Test Comput. 15 (2) (1998)
Vladimír Székely, András Poppe, Andras Pahi, Alpar Csendes, G. Hajas, Márta Rencz
Electro-thermal and logi-thermal simulation of VLSI designs. IEEE Trans. Very Large Scale Integr. Syst. 5 (3) (1997)
Vladimír Székely, Márta Rencz, Bernard Courtois
Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS (1997)
Vladimír Székely, Andras Pahi, András Poppe, Márta Rencz, Alpar Csendes
SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. ED&TC (1997)
Vladimír Székely, Márta Rencz
Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. ICCAD (1997)
Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
CAD and Foundries for Microsystems. DAC (1997)
Vladimír Székely, Cs. Márta, Zsolt Kohári, Márta Rencz
CMOS sensors for on-line thermal monitoring of VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 5 (3) (1997)
Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely
Applied design and analysis of microsystems. ED&TC (1996)
Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium (1996)
Vladimír Székely, András Poppe, Márta Rencz, Gabor Farkas, Alpar Csendes, Andras Pahi
An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework. ED&TC (1996)
Vladimír Székely, Márta Rencz
Thermal test and monitoring [microelectronic structures]. ED&TC (1995)
Éva Nikodémusz-Székely, Vladimír Székely
Image recognition problems of fingerprint identification. Microprocess. Microsystems 17 (4) (1993)