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Thermal test and monitoring [microelectronic structures].

Vladimír SzékelyMárta Rencz
Published in: ED&TC (1995)
Keyphrases
  • real time
  • monitoring system
  • infrared
  • data sets
  • databases
  • feature selection
  • image processing
  • website
  • data structure
  • decision support
  • data acquisition
  • statistical tests
  • structural features