IDDQ Testing of Submicron CMOS - by Cooling?

Márta Rencz Vladimír Székely S. Török Kholdoun Torki Bernard Courtois

Published in: J. Electron. Test. (2000)

Keyphrases

vlsi circuits
low power
high speed
power consumption
test cases
data sets
data mining
low cost
simulated annealing
genetic algorithm
power supply
electron beam
neural network
machine learning
software testing
circuit design
digital signal processing