Die Attach Quality Testing by Fully Contact-less Measurement Method.
György BognárGyula HorváthZoltán SzucsVladimír SzékelyPublished in: DDECS (2006)
Keyphrases
- prior knowledge
- detection method
- computational cost
- high accuracy
- classification method
- high quality
- error rate
- fully automatic
- computer vision
- segmentation method
- clustering method
- preprocessing
- main contribution
- classification accuracy
- pairwise
- computational complexity
- mathematical model
- matching algorithm
- similarity measure
- test data
- image segmentation