Takuji Okamoto

Publication Activity (10 Years)

Years Active: 1983-2007
Publications (10 Years): 0

Publications

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. (3) (2007)
Masahiro Kawai, Yoichiro Sato, Hiroto Kagotani, Takuji Okamoto
Superconductive logic circuits constructed by the use of two thresholds of SQUID. Systems and Computers in Japan 36 (2) (2005)
Mitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya
Model analysis of coronary hemodynamics incorporating autoregulation. Systems and Computers in Japan 35 (14) (2004)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. (3) (2004)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium (2003)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium (2002)
Nariyoshi Yamai, Kiyohiko Okayama, Hiroshi Shimamoto, Takuji Okamoto
A dynamic traffic sharing with minimal administration on multihomed networks. ICC (2001)
Hiroto Kagotani, Takuji Okamoto, Takashi Nanya
Synthesis of four-phase asynchronous control circuits from pipeline dependency graphs. ASP-DAC (2001)
Hiroto Kagotani, Yoichiro Sato, Yoshimichi Takahara, Takuji Okamoto
A method of affine transformation for rectangular video image. Systems and Computers in Japan 31 (7) (2000)
Yoichiro Sato, Yoshinobu Yamasoto, Masanori Saito, Hiroto Kagotani, Takuji Okamoto, Masahiro Kawai
Systematic reducing of metastable operations in CMOS D flip-flops. Systems and Computers in Japan 31 (3) (2000)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium (1997)
Atsushi Ohnishi, Yuji Sugiyama, Takuji Okamoto
Timing verification of asynchronous sequential circuits with specifications - A method of reducing state transitions to be verified in detail. Systems and Computers in Japan 27 (11) (1996)
Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi
A method of shortening metastable operation duration time by the use of feedback. Systems and Computers in Japan 27 (10) (1996)
Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto
Realization of multiwindow system with high-speed operations of nonrectangular windows. Systems and Computers in Japan 27 (10) (1996)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium (1996)
Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto
The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. IEICE Trans. Inf. Syst. (7) (1995)
Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto
Universal test complexity of field-programmable gate arrays. Asian Test Symposium (1995)
Toshiyuki Maeda, Yoichiro Sato, Tokumi Yokohira, Takuji Okamoto
Decentralized priority encoder and its applications. Systems and Computers in Japan 22 (10) (1991)
Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita
Design of High-Level Test Language for Digital LSI. ITC (1983)