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CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.

Hiroyuki MichinishiTokumi YokohiraTakuji OkamotoToshifumi KobayashiTsutomu Hondo
Published in: Asian Test Symposium (2002)
Keyphrases
  • power supply
  • defect detection
  • intelligent control
  • high frequency
  • feature extraction
  • floating gate
  • wireless sensor networks