Toshifumi Kobayashi

Publication Activity (10 Years)

Years Active: 1996-2007
Publications (10 Years): 0

Publications

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. (3) (2007)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. (3) (2004)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium (2003)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium (2002)
Yoichiro Sato, Takuji Okamoto, Yuji Sugiyama, Masahiro Kawai, Toshifumi Kobayashi
A method of shortening metastable operation duration time by the use of feedback. Systems and Computers in Japan 27 (10) (1996)