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Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.

Hiroyuki MichinishiTokumi YokohiraTakuji OkamotoToshifumi KobayashiTsutomu Hondo
Published in: Asian Test Symposium (2003)
Keyphrases
  • floating gate
  • circuit design
  • image quality
  • high speed
  • low cost
  • feature space
  • multi objective
  • power consumption
  • low voltage