Hiroyuki Michinishi

Publication Activity (10 Years)

Years Active: 1995-2007
Publications (10 Years): 0

Publications

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. (3) (2007)
Mitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya
Model analysis of coronary hemodynamics incorporating autoregulation. Systems and Computers in Japan 35 (14) (2004)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Trans. Inf. Syst. (3) (2004)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium (2003)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium (2002)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium (1997)
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara
A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium (1996)
Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto
The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. IEICE Trans. Inf. Syst. (7) (1995)
Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto
Universal test complexity of field-programmable gate arrays. Asian Test Symposium (1995)