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Testing for the programming circuit of LUT-based FPGAs.
Hiroyuki Michinishi
Tokumi Yokohira
Takuji Okamoto
Tomoo Inoue
Hideo Fujiwara
Published in:
Asian Test Symposium (1997)
Keyphrases
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programming language
high speed
programming environment
delay insensitive
general purpose
test cases
database
hardware implementation
inverse halftoning
heuristic search
analog vlsi
electronic circuits
analog circuits
circuit design
software engineering
digital images
high level