Universal test complexity of field-programmable gate arrays.
Tomoo InoueHideo FujiwaraHiroyuki MichinishiTokumi YokohiraTakuji OkamotoPublished in: Asian Test Symposium (1995)
Keyphrases
- field programmable gate array
- hardware software co design
- hardware implementation
- embedded systems
- hardware design
- programmable logic
- parallel computing
- parallel architectures
- fpga technology
- digital signal processing
- computing systems
- image processing algorithms
- general purpose
- image processing
- parallel programming
- host computer
- hardware software
- hardware architecture
- pairwise