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Detection of CMOS Open Node Defects by Frequency Analysis.
Hiroyuki Michinishi
Tokumi Yokohira
Takuji Okamoto
Toshifumi Kobayashi
Tsutomu Hondo
Published in:
IEICE Trans. Inf. Syst. (2007)
Keyphrases
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frequency analysis
frequency domain
power spectrum
low cost
high speed
detection method
palmprint
computer vision
high quality
object detection
power consumption