Takahiro Uchida

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 5

Top Topics

Special Education

Top Venues

Publications

Takahiro Uchida
Taste Sensor Assessment of Bitterness in Medicines: Overview and Recent Topics. Sensors 24 (15) (2024)
Daisuke Chugo, Miyabi Igarashi, Satoshi Muramatsu, Sho Yokota, Jin-Hua She, Hiroshi Hashimoto, Uemura Takashi, Hiroaki Kamishina, Yoshiharu Hata, Takayuki Yamada, Takahiro Uchida
Analysis of the musculoskeletal effects of lower limb slippage when indoor dogs walk on the wooden floor. ISIE (2024)
Jumpei Yoshimatsu, Kiyoshi Toko, Yusuke Tahara, Misaki Ishida, Masaaki Habara, Hidekazu Ikezaki, Honami Kojima, Saeri Ikegami, Miyako Yoshida, Takahiro Uchida
Development of Taste Sensor to Detect Non-Charged Bitter Substances. Sensors 20 (12) (2020)
Iwao Kobayashi, Kiwamu Sato, Takahiro Uchida, Hiroshi Nunokawa
Compact Calibration-Free Eye-Tracking System for Students with Severe Physical and Intellectual Disabilities. ICTA (2019)
Iwao Kobayashi, Kiwamu Sato, Nanami Chiba, Hiroshi Nunokawa, Takahiro Uchida
Calibration-Free Eye- Tracking System in Education for Students with Severe Physical and Intellectual Disabilities. TALE (2018)
Koji Matsuura, Takahiro Uchida, Satoshi Ogawa, Chao Guan, Shinichiro Yanase
Surface interaction of microbubbles and applications of hydrogen-bubble method for cleaning and separation. MHS (2015)
Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Tsutomu Yoshihara, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara
A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die. IEEE J. Solid State Circuits 43 (1) (2008)
Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara
A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die. ISSCC (2007)