A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die.
Shigeki OhbayashiMakoto YabuuchiKazushi KonoYuji OdaSusumu ImaokaKeiichi UsuiToshiaki YonezuTakeshi IwamotoKoji NiiYasumasa TsukamotoMasashi ArakawaTakahiro UchidaMasakazu OkadaAtsushi IshiiTsutomu YoshiharaHiroshi MakinoKoichiro IshibashiHirofumi ShinoharaPublished in: IEEE J. Solid State Circuits (2008)