A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die.
Shigeki OhbayashiMakoto YabuuchiKazushi KonoYuji OdaSusumu ImaokaKeiichi UsuiToshiaki YonezuTakeshi IwamotoKoji NiiYasumasa TsukamotoMasashi ArakawaTakahiro UchidaMasakazu OkadaAtsushi IshiiHiroshi MakinoKoichiro IshibashiHirofumi ShinoharaPublished in: ISSCC (2007)