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A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die.

Shigeki OhbayashiMakoto YabuuchiKazushi KonoYuji OdaSusumu ImaokaKeiichi UsuiToshiaki YonezuTakeshi IwamotoKoji NiiYasumasa TsukamotoMasashi ArakawaTakahiro UchidaMasakazu OkadaAtsushi IshiiHiroshi MakinoKoichiro IshibashiHirofumi Shinohara
Published in: ISSCC (2007)
Keyphrases
  • dynamic random access memory
  • random access memory
  • neural network
  • embedded systems
  • levels of abstraction
  • higher level
  • social networks
  • data fusion