Sergej Deutsch

Publication Activity (10 Years)

Years Active: 2011-2021
Publications (10 Years): 12

Top Topics

Integrated Circuit

Communication Bandwidth

Top Venues

IACR Cryptol. ePrint Arch.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Michael LeMay, Joydeep Rakshit, Sergej Deutsch, David M. Durham, Santosh Ghosh, Anant Nori, Jayesh Gaur, Andrew Weiler, Salmin Sultana, Karanvir Grewal, Sreenivas Subramoney
Cryptographic Capability Computing. MICRO (2021)
Michael E. Kounavis, David Durham, Sergej Deutsch, Krystian Matusiewicz, David Wheeler
The MAGIC Mode for Simultaneously Supporting Encryption, Message Authentication and Error Correction. IACR Cryptol. ePrint Arch. 2020 (2020)
Santosh Ghosh, Michael E. Kounavis, Sergej Deutsch
Gimli Encryption in 715.9 psec. IACR Cryptol. ePrint Arch. 2020 (2020)
Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham
Κ-Cipher: A Low Latency, Bit Length Parameterizable Cipher. IACR Cryptol. ePrint Arch. 2020 (2020)
Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal
Security definitions, entropy measures and constructions for implicitly detecting data corruption. Comput. Commun. 160 (2020)
Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham
K-Cipher: A Low Latency, Bit Length Parameterizable Cipher. ISCC (2020)
Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal
IVP: A Three Level Confusion-Diffusion Network Supporting Implicit Data Integrity. ISCC (2019)
Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani, Antonios Papadimitriou, Ken Grewal
There is No Need to Waste Communication Bandwidth on MACs. GIIS (2018)
Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani
Implicit Data Integrity: Protecting User Data without MACs. ICETE (2) (2018)
Michael E. Kounavis, David Durham, Sergej Deutsch, Antonios Papadimitriou, Amitabh Das
Cryptographic Constructions Supporting Implicit Data Integrity. IACR Cryptol. ePrint Arch. 2018 (2018)
Michael E. Kounavis, Sergej Deutsch, David Durham, Saeedeh Komijani
Non-recursive computation of the probability of more than two people having the same birthday. ISCC (2017)
Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty
The hype, myths, and realities of testing 3D integrated circuits. ICCAD (2016)
Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen
Robust Optimization of Test-Access Architectures Under Realistic Scenarios. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (11) (2015)
Sergej Deutsch, Krishnendu Chakrabarty
Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators. ITC (2015)
Sergej Deutsch, Krishnendu Chakrabarty
Test and debug solutions for 3D-stacked integrated circuits. ITC (2015)
Sergej Deutsch, Krishnendu Chakrabarty
Software-based test and diagnosis of SoCs using embedded and wide-I/O DRAM. ASP-DAC (2015)
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
Test and Design-for-Testability Solutions for 3D Integrated Circuits. IPSJ Trans. Syst. LSI Des. Methodol. 7 (2014)
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
Test and Design-for-Testability Solutions for 3D Integrated Circuits. Inf. Media Technol. 9 (4) (2014)
Sergej Deutsch, Krishnendu Chakrabarty
Contactless Pre-Bond TSV Test and Diagnosis Using Ring Oscillators and Multiple Voltage Levels. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (5) (2014)
Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr
Vesuvius-3D: A 3D-DfT demonstrator. ITC (2014)
Sergej Deutsch, Krishnendu Chakrabarty
Massive signal tracing using on-chip DRAM for in-system silicon debug. ITC (2014)
Sergej Deutsch, Krishnendu Chakrabarty
Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels. DATE (2013)
Sergej Deutsch, Krishnendu Chakrabarty
Robust optimization of test-architecture designs for core-based SoCs. ETS (2013)
Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen
Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs. ITC (2013)
Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen
DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks. ITC (2012)
Sergej Deutsch, Krishnendu Chakrabarty, Shreepad Panth, Sung Kyu Lim
TSV Stress-Aware ATPG for 3D Stacked ICs. Asian Test Symposium (2012)
Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel
Automation of 3D-DfT Insertion. Asian Test Symposium (2011)