Test and Design-for-Testability Solutions for 3D Integrated Circuits.
Krishnendu ChakrabartyMukesh AgrawalSergej DeutschBrandon NoiaRan WangFangming YePublished in: IPSJ Trans. Syst. LSI Des. Methodol. (2014)
Keyphrases
- integrated circuit
- built in self test
- user interface
- case study
- engineering design
- design process
- test data generation
- computer aided
- real time
- building blocks
- database
- test cases
- simulated annealing
- learning environment
- optimal solution
- design decisions
- experimental design
- simulated annealing algorithm
- artificial intelligence