Massive signal tracing using on-chip DRAM for in-system silicon debug.

Sergej Deutsch Krishnendu Chakrabarty

Published in: ITC (2014)

Keyphrases

high density
cmos technology
high speed
low cost
signal processing
thin film
data center
data analysis
non stationary
field effect transistors
dynamic random access memory
memory subsystem
charge coupled device
high frequency
low voltage
main memory
low power
novice programmers
signal acquisition
electro optic