Magali Bastian

Publication Activity (10 Years)

Years Active: 2005-2009
Publications (10 Years): 0

Publications

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 17 (10) (2009)
Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
A new design-for-test technique for SRAM core-cell stability faults. DATE (2009)
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE (2008)
Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC (2008)
Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert
Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI (2008)
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS (2008)
Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert
A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. DELTA (2008)
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE (2007)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electron. Test. 23 (5) (2007)
Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel
Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. ATS (2007)
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS (2007)
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS (2007)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS (2006)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC (2005)