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Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.
Alexandre Ney
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Magali Bastian
Published in:
VTS (2007)
Keyphrases
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fault diagnosis
neural network
real time
genetic algorithm
website
test cases
data access
fault detection
read write
abnormal events