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Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior.

Magali BastianVincent GouinPatrick GirardChristian LandraultAlexandre NeySerge PravossoudovitchArnaud Virazel
Published in: ATS (2007)
Keyphrases
  • low voltage
  • neural network
  • human behavior
  • data transmission
  • random access memory
  • data sets
  • social networks
  • power consumption
  • low power
  • factors influencing
  • microscopy images
  • dynamic random access memory