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Analysis of Resistive-Open Defects in SRAM Sense Amplifiers.

Alexandre NeyPatrick GirardSerge PravossoudovitchArnaud VirazelMagali Bastian
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
  • data analysis
  • real time
  • information systems
  • quantitative analysis
  • data transmission
  • feature extraction
  • digital libraries
  • wireless sensor networks