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Slow write driver faults in 65nm SRAM technology: analysis and March test solution.

Alexandre NeyPatrick GirardChristian LandraultSerge PravossoudovitchArnaud VirazelMagali Bastian
Published in: DATE (2007)
Keyphrases
  • statistical analysis
  • neural network
  • data processing
  • cost effective
  • test cases
  • rapid development
  • data mining
  • information technology
  • future development