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Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.

Luigi DililloPatrick GirardSerge PravossoudovitchArnaud VirazelMagali Bastian
Published in: DAC (2005)
Keyphrases
  • data analysis
  • statistical analysis
  • database
  • data sets
  • neural network
  • machine learning
  • information systems
  • quantitative analysis
  • flow analysis