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Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.

Alexandre NeyPatrick GirardChristian LandraultSerge PravossoudovitchArnaud VirazelMagali Bastian
Published in: ETS (2007)
Keyphrases
  • dynamic environments
  • fault diagnosis
  • database
  • multiresolution
  • data sets
  • genetic algorithm
  • information systems
  • image analysis
  • control system
  • fault detection and isolation