Kunhyuk Kang

Publication Activity (10 Years)

Years Active: 2005-2010
Publications (10 Years): 0

Publications

Seung Hoon Choi, Kunhyuk Kang, Florentin Dartu, Kaushik Roy
Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (3) (2010)
Ik Joon Chang, Jongsun Park, Kunhyuk Kang, Kaushik Roy
Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling. IET Circuits Devices Syst. 4 (6) (2010)
Kunhyuk Kang, Sang Phill Park, Keejong Kim, Kaushik Roy
On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures. IEEE Trans. Very Large Scale Integr. Syst. 18 (2) (2010)
Sang Phill Park, Kunhyuk Kang, Kaushik Roy
Reliability Implications of Bias-Temperature Instability in Digital ICs. IEEE Des. Test Comput. 26 (6) (2009)
Jing Li, Kunhyuk Kang, Kaushik Roy
Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (1) (2009)
Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC (2008)
Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy
Design Under Parameter Variations in Nanoscale Technologies. IEEE Trans. Very Large Scale Integr. Syst. 15 (6) (2007)
Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy
Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ. ITC (2007)
Kunhyuk Kang, Haldun Kufluoglu, Kaushik Roy, Muhammad Ashraful Alam
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (10) (2007)
Kunhyuk Kang, Keejong Kim, Kaushik Roy
Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop. DAC (2007)
Jing Li, Kunhyuk Kang, Aditya Bansal, Kaushik Roy
High Performance and Low Power Electronics on Flexible Substrate. DAC (2007)
Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (4) (2007)
Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. DAC (2007)
Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD (2007)
Kunhyuk Kang, Bipul C. Paul, Kaushik Roy
Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters. ACM Trans. Design Autom. Electr. Syst. 11 (4) (2006)
Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits. DATE (2006)
Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI. ICCD (2006)
Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy
designs in nano-scale technologies under process parameter variations. ISLPED (2005)
Amit Agarwal, Kunhyuk Kang, Kaushik Roy
Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations. ICCAD (2005)
Kunhyuk Kang, Bipul Chandra Paul, Kaushik Roy
Statistical Timing Analysis using Levelized Covariance Propagation. DATE (2005)
Ik Joon Chang, Kunhyuk Kang, Saibal Mukhopadhyay, Chris H. Kim, Kaushik Roy
Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling. CICC (2005)
Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy
Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. ITC (2005)