Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling.
Ik Joon ChangJongsun ParkKunhyuk KangKaushik RoyPublished in: IET Circuits Devices Syst. (2010)
Keyphrases
- accurate estimation
- critical points
- scale space
- failure rate
- random sample
- deep structure
- random sampling
- vector field
- probability distribution
- monte carlo
- sampling algorithm
- gaussian scale space
- sample size
- power consumption
- parameter space
- feature points
- morse theory
- multi armed bandit
- data transmission
- sampling strategy
- neural network
- pattern recognition