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Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.
Kunhyuk Kang
Keejong Kim
Ahmad E. Islam
Muhammad Ashraful Alam
Kaushik Roy
Published in:
DAC (2007)
Keyphrases
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correlation analysis
high speed
estimation error
estimation algorithm
accurate estimation
information systems
case study
parameter estimation
steady state
estimation process
digital circuits
electronic circuits
tunnel diode