Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling.
Ik Joon ChangKunhyuk KangSaibal MukhopadhyayChris H. KimKaushik RoyPublished in: CICC (2005)
Keyphrases
- accurate estimation
- critical points
- failure rate
- vector field
- deep structure
- probability distribution
- scale space
- random sample
- data transmission
- power consumption
- nano scale
- monte carlo
- sample size
- random sampling
- feature points
- multi armed bandit
- morse theory
- low power
- mobile robot
- principal component analysis
- wireless sensor networks
- pattern recognition
- gaussian scale space
- training data
- social networks