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Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring.
Saibal Mukhopadhyay
Kunhyuk Kang
Hamid Mahmoodi
Kaushik Roy
Published in:
ITC (2005)
Keyphrases
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nano scale
monitoring system
real time
activity monitoring
power consumption
data mining
cost effective
neural network
emerging technologies
data transmission
leakage current
end to end
integrity constraints
data acquisition
sufficient conditions
decision support
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