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NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?
Kunhyuk Kang
Saakshi Gangwal
Sang Phill Park
Kaushik Roy
Published in:
ASP-DAC (2008)
Keyphrases
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linear equations
delay insensitive
logic synthesis
random access memory
closed form
logic circuits
integer programming
low cost
memory requirements
solution quality
memory size