Katsuyoshi Miura

Publication Activity (10 Years)

Years Active: 1997-2018
Publications (10 Years): 2

Top Topics

Evaluation Method

Electronic Circuits

Malicious Attacks

Top Venues

Microelectron. Reliab.

Publications

Katsuyoshi Miura, Atsuki Seko, Koji Nakamae
Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope. Microelectron. Reliab. (2018)
Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae
NBTI/PBTI tolerant arbiter PUF circuits. IOLTS (2017)
Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. Microelectron. Reliab. 51 (9-11) (2011)
Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa
Laser THz emission microscope as a novel tool for LSI failure analysis. Microelectron. Reliab. 49 (9-11) (2009)
Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. IEICE Trans. Electron. (3) (2009)
Katsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka
A low energy FIB processing, repair, and test system. Microelectron. Reliab. 43 (9-11) (2003)
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
CAD navigation system, for backside waveform probing of CMOS devices. Microelectron. Reliab. 42 (9-11) (2002)
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
Development of an EB/FIB Integrated Test System. Microelectron. Reliab. 41 (9-10) (2001)
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
Intelligent EB Test System for Automatic VLSI Fault Tracing. Asian Test Symposium (1999)
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System. J. Electron. Test. 10 (3) (1997)
Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka
Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. Asian Test Symposium (1997)
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system. ASP-DAC (1997)