Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.
Katsuyoshi MiuraKohei NakataKoji NakamaeHiromu FujiokaPublished in: Asian Test Symposium (1997)
Keyphrases
- training data
- data sets
- database
- data distribution
- data structure
- data points
- data analysis
- raw data
- data sources
- data collection
- statistical analysis
- synthetic data
- image data
- experimental data
- statistical methods
- data quality
- computer systems
- data extraction
- data processing
- signal processing
- data mining techniques
- high speed
- information extraction
- end users
- high quality
- decision trees
- neural network