Intelligent EB Test System for Automatic VLSI Fault Tracing.

Katsuyoshi Miura Koji Nakamae Hiromu Fujioka

Published in: Asian Test Symposium (1999)

Keyphrases

signal processing
fault diagnosis
fault detection
decision support
fully automatic
data sets
artificial intelligence
pattern recognition
database
machine learning
decision trees
bayesian networks
intelligent systems
fine grained
vlsi circuits
multiple faults