Kiyoshi Nikawa

Publication Activity (10 Years)

Years Active: 1997-2013
Publications (10 Years): 0

Top Topics

High Resolution

Diffusion Process

Simulation Software

Defect Detection

Top Venues

Microelectron. Reliab.

Publications

Yasunori Goto, Toru Matsumoto, Kiyoshi Nikawa
Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique. Microelectron. Reliab. 53 (9-11) (2013)
Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. Microelectron. Reliab. 51 (9-11) (2011)
Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa
Laser THz emission microscope as a novel tool for LSI failure analysis. Microelectron. Reliab. 49 (9-11) (2009)
Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. IEICE Trans. Electron. (3) (2009)
Kiyoshi Nikawa
How long can we succeed using the OBIRCH and its derivatives? ITC (2004)
Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium (1999)
Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium (1999)
Kiyoshi Nikawa, Shoji Inoue
New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. Asian Test Symposium (1997)