Shoji Inoue

Publication Activity (10 Years)

Years Active: 1997-2009
Publications (10 Years): 0

Publications

Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. IEICE Trans. Electron. (3) (2009)
Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium (1999)
Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone
Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium (1999)
Kiyoshi Nikawa, Shoji Inoue
New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. Asian Test Symposium (1997)