Login / Signup
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.
Kiyoshi Nikawa
Shoji Inoue
Tatsuoki Nagaishi
Toru Matsumoto
Katsuyoshi Miura
Koji Nakamae
Published in:
IEICE Trans. Electron. (2009)
Keyphrases
</>
image analysis
medical images
statistical analysis
neural network
data mining
search engine
case study
data analysis