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The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.

Kiyoshi NikawaMasatsugu YamashitaToru MatsumotoKatsuyoshi MiuraYoshihiro MidohKoji Nakamae
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • fault localization
  • fault detection
  • fault isolation
  • neural network
  • model based diagnosis
  • fault diagnosis
  • visual inspection
  • database
  • real world
  • relational databases
  • control system
  • data abstraction