The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.
Kiyoshi NikawaMasatsugu YamashitaToru MatsumotoKatsuyoshi MiuraYoshihiro MidohKoji NakamaePublished in: Microelectron. Reliab. (2011)