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Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.
Katsuyoshi Miura
Koji Nakamae
Hiromu Fujioka
Published in:
J. Electron. Test. (1997)
Keyphrases
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image data
data sets
high quality
data processing
data analysis
data structure
test data
database
data collection
vlsi circuits
raw data
data distribution
experimental data
data points
data sources
spatial data
probability distribution
neural network
statistical significance
learning algorithm