K. Daoud

Publication Activity (10 Years)

Years Active: 2009-2014
Publications (10 Years): 0

Top Topics

Radio Frequency

Electrical Properties

Statistical Tests

Leakage Current

Top Venues

Microelectron. J.

Microelectron. Reliab.

Publications

Mohamed Ali Belaïd, M. Gares, K. Daoud, Olivier Latry
Performance drifts of N-MOSFETs under pulsed RF life test. Microelectron. Reliab. 54 (9-10) (2014)
Mohamed Ali Belaïd, Ahmed M. Nahhas, M. Gares, K. Daoud, Olivier Latry
Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectron. J. 45 (12) (2014)
Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline
Failure analysis of hot-electron effect on power RF N-LDMOS transistors. DTIS (2012)
Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline
S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects. Microelectron. Reliab. 51 (9-11) (2011)
A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50 (12) (2010)
Mohamed Ali Belaïd, K. Daoud
Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors. Microelectron. Reliab. 50 (9-11) (2010)
A. Alaeddine, M. Kadi, K. Daoud, B. Mazari
Effects of electromagnetic near-field stress on SiGe HBT's reliability. Microelectron. Reliab. 49 (9-11) (2009)